منابع مشابه
Ferroelectricity in ultra-thin perovskite films
We report studies of ferroelectricity in ultra-thin perovskite films with realistic electrodes. The results reveal stable ferroelectric states in thin films less than 10 Å thick with polarization normal to the surface. Under short-circuit boundary conditions, the screening effect of realistic electrodes and the influence of real metal/oxide interfaces on thin film polarization are investigated....
متن کاملFerroelectricity and tetragonality in ultrathin PbTiO3 films.
The evolution of tetragonality with thickness has been probed in epitaxial c-axis oriented PbTiO3 films with thicknesses ranging from 500 down to 24 A. High resolution x ray pointed out a systematic decrease of the c-axis lattice parameter with decreasing film thickness below 200 A. Using a first-principles model Hamiltonian approach, the decrease in tetragonality is related to a reduction of t...
متن کاملFerroelectricity in strain-free SrTiO3 thin films.
Biaxial strain is known to induce ferroelectricity in thin films of nominally nonferroelectric materials such as SrTiO3. By a direct comparison of the strained and strain-free SrTiO3 films using dielectric, ferroelectric, Raman, nonlinear optical and nanoscale piezoelectric property measurements, we conclude that all SrTiO3 films and bulk crystals are relaxor ferroelectrics, and the role of str...
متن کاملPossible ferroelectricity in perovskite oxynitride SrTaO2N epitaxial thin films
1 Department of Chemistry, School of Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-0033 Japan 2 Kanagawa Academy of Science and Technology (KAST), 3-2-1 Sakado, Takatsu, Kawasaki 213-0012 Japan 3 CREST, Japan Science and Technology Agency, 7-3-1 Hongo, Bunkyo, Tokyo 113-0033 Japan 4 Tandem Accelerator Complex, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, 305-8577 5 Departm...
متن کاملFerroelectricity and Self-Polarization in Ultrathin Relaxor Ferroelectric Films
We report ferroelectricity and self-polarization in the (001) oriented ultrathin relaxor ferroelectric PMN-PT films grown on Nb-SrTiO3, SrRuO3 and La0.7Sr0.3MnO3, respectively. Resistance-voltage measurements and AC impedance analysis suggest that at high temperatures Schottky depletion width in a 4 nm thick PMN-PT film deposited on Nb-SrTiO3 is smaller than the film thickness. We propose that ...
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ژورنال
عنوان ژورنال: Physical Review Letters
سال: 2002
ISSN: 0031-9007,1079-7114
DOI: 10.1103/physrevlett.89.147601